Abstract: In recent years, the number of test vectors has increased due to VLSI circuit density and complexity. A test compaction technique can reduce the number of test vectors without losing fault ...

Abstract: Test set compaction is one of the key steps of the postproduction test known to bring down test pattern counts. This, in turn, allows one to reduce the corresponding test data volume, test ...

Ask the publishers to restore access to 500,000+ books. An icon used to represent a menu that can be toggled by interacting with this icon. A line drawing of the Internet Archive headquarters building ...