Graphene is a monolayer of graphite that is of significant interest because of its wide variety of applications in the semiconductor, healthcare, and aerospace fields. The unique properties of ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The FilmTek™ 2000M TSV is a fully ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...

The UVISEL+ RM extends the capability of the UVISEL with an independent Reflectometry Module (RM). The RM module is available as an option or an upgrade for current models of the VISible and NIR ...

Combining spectroscopic reflectometry and spectroscopic ellipsometry, the Atlas-M metrology system fully characterizes both masks and reticles, including line width, etch depth, overhang, height, and ...

Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...

UV, VIS & NIR Reflectometers & Spectroscopic Ellipsometers for semi-transparent thin film charcterisation; Optical Emission Spectroscopy (OES) systems; Plasma Monitoring & Process Control Systems The ...

“As smaller structures are being increasingly adopted in the semiconductor industry, the performance of memory and logic devices is being continuously improved with innovative 3D integration schemes ...

Neutron reflectometry is a powerful analytical technique used to study the structure and composition of thin films, multilayers, and interfaces at the nanoscale. It involves directing a beam of ...