Researchers at the Technical University of Munich (TUM) have developed a method for diagnosing urinary tract infections that ...

With complexity of sub-90nm SOCs driving the need for test to be integrated throughout the design process, both of EDA’s largest vendors today introduced major upgrades to their respective offerings.

Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...