Hackaday

Pocket-sized Test Pattern Generator Helps Check Those CRTs

Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based ...
Electronic Design

Test Pattern Compression Saves Time and Bits

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...
EDN

Design for test boot camp, part 4: Built-in self-test

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then ...
Electronic Design

Output Capacitance Optimization and Picking the Right Slammer—An Introduction

Existing test solutions aren’t always suitable for the latest improvements in switching regulator technology. Transient load testing can address these inequities. In response to the recent ...
Design-Reuse

Resolution of Interoperability challenges in Automatic Test Point insertion across different EDA vendors

In both of the above cases the outcome will be a file having Test Point type and location where it has to be inserted (along with other relevant information dependent on tool eg. probable equivalent ...